Stage Micrometers & Grids S-Series

The scale or grid is chrome deposited centrally on a glass disc mounted in a black anodised aluminium slide mount 76mm x 25mm x 1.5mm thick. The metal mount gives these stage micrometers greater durability than those of all glass construction. These products are supplied in a plastic case with foam insert.
Available in transmitted and reflected (incident) light versions. All transmitted light stage micrometers, except the s48 and s18, have a no.0 cover glass optically cemented over the image.
This range of stage micrometers do not have unique serial numbers, so technically are not traceable. Many quality inspectors require any calibration tools to have unequivocal traceability, so a stamped or engraved serial number, for this we have our ps range of calibration scales.

STAGE MICROMETER : S1,S2,S4 ,S8, S11, S12, S16, S22, S48
STAGE COUNTING GRID : S9,S10,S28 ,S29
STAGE MICROMETER GROUPED GRADUATIONS : S21
HSE/NPL MK III TEST SLIDE : S84
VIBRATION TEST SLIDE : S25
METRIC/IMPERIAL : S18,S20
REFLECTED LIGHT STAGE MICROMETER : S1R,S4R,S78
HALTON FINDER SLIDE : S30
ENGLAND FINDER SLIDE : S7
PARTICLE ANALYSIS TEST/CALIBRATION SLIDE : SG7

Key Features

Transmitted light stage micrometer with 10mm scale subdivided into 0.1mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.005mm

Accuracy (overall): <0.002mm

Key Features

Transmitted light stage slide with 10 x 10 grid of 0.05mm squares

Line width: 0.004mm

Accuracy (overall): <0.0015mm

Key Features

Transmitted light stage micrometer with 0.005″ scale subdivided into 0.0001″ divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x 25mm x 1.5mm thick.

Line width: 0.001mm

Accuracy (overall): <0.00005"

Key Features

Transmitted light stage micrometer with 0.1mm scale subdivided into 0.002mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.001mm

Accuracy (overall): <0.001mm

Image of product showing locating ring with cross and enlarged central scale detail.

Key Features

Transmitted light stage micrometer with crossed scales, each 1mm subdivided into 0.01mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.0015mm

Accuracy (overall): <0.001mm

Key Features

Graduated Double Scale 25mm and 1 inch Micrometer

Metric & Imperial stage micrometer with double graduated scale

For the calibration of measurement instruments across a wide range of magnifications

This graduated scale stage micrometer is suitable for low magnification, stereo inspection microscopes to higher magnification compound microscopes.

The double scale (metric & English), extends this flexibility further, suiting Quality Control Departments that serve all international markets

The mm and inch scales are centred on all glass slide 76mm x 25mm x 1.5mm thick.

Line width: 0.0025mm

Accuracy (overall): 0.002mm

Key Features

Reflected light stage micrometer with 10mm scale subdivided into 0.1mm divisions

Line width: 0.005mm

Accuracy (overall): <0.002mm

Key Features

Transmitted light stage micrometer with 5mm scale subdivided into 0.05mm

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.005mm

Accuracy (overall): <0.0015mm

Key Features

Transmitted light stage micrometer with double scale 2mm scale subdivided into 0.01mm divisions and 0.1inch subdivided into 0.0005inch divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x 25mm x 1.5mm thick.

Line width: 0.002mm (+0.001mm)

Accuracy (overall): <0.0015mm

Key Features

Transmitted light stage micrometer with grouped graduations 5mm total length in 0.5mm divisions, 2mm section is further divided into 0.1mm divisions and final 0.2mm has 0.01mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.0025mm

Accuracy (overall): <0.002mm

Key Features

Transmitted light stage micrometer with vertical 2mm scale subdivided into 0.01mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x 25mm x 1.5mm thick.

Line width: 0.0025mm

Accuracy (overall): <0.0015mm

Key Features

Pairs of dots of decreasing separation which appear to merge during vibration tests

Key Features

Transmitted light stage slide with 20 x 20 grid of 0.01mm squares

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.003mm

Accuracy (overall): <0.0015mm

Key Features

Transmitted light stage slide with 1.5mm x 1.5mm grid of 0.01mm squares

Line width: 0.003mm

Accuracy (overall): <0.0015mm

Key Features

Identical pattern to the S7 England Finder but with a smaller area of 5mm x 5mm

Key Features

Transmitted light stage micrometer with 0.1″ scale subdivided into 0.001″ divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.002mm

Accuracy (overall): <0.0001"

Key Features

Transmitted light stage micrometer with 1mm scale subdivided into 0.01mm divisions, no cover glass fitted

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x 25mm x 1.5mm thick.

Line width: 0.0027mm

Accuracy (overall): <0.0015mm

Key Features

Reflected light stage micrometer with 0.1″ scale subdivided into 0.001″ divisions

Line width: 0.002mm

Accuracy (overall): <0.0001"

Key Features

Unique slide for recording the position of areas of interest. 9045 findable locations, each uniquely indexed.

The England Finder is a glass microscope slide with a uniquely indexed grid pattern that allows individual areas of interest to be referenced.

All England Finders produced by Pyser-Optics over the last 40 years are identical. The purpose of the slide is to give microscopists an easy method of recording the position of a particular area of interest, so that the same position can be re-located at a later date, or by another person in another laboratory, or when using an England Finder in another microscope.

The location of the positioning arrows is identical for all England Finder slides. The method of use is as follows: Mark a label on the left hand side of the specimen slide, indicating the orientation to be repeated. Locate any area of interest on the slide then, without moving the stage, replace the specimen slide with the England Finder, the feature of interest can then be identified and noted from the index pattern. The area of interest can then be relocated at any time using the reverse of this procedure.

Key Features

NEW HIGH DEFINITION VERSION

Reflected light stage micrometer with 1mm scale subdivided into 0.01mm divisions

The S78 has a new high definition image to improve calibration resolution and allow line centre or line edge calibrations.

Line width: 0.002mm (+0.001mm)

Accuracy (overall): <0.001mm

Key Features

Transmitted light stage micrometer with 1mm scale subdivided into 0.01mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.002mm

Accuracy (overall): <0.001mm

Key Features

Phase contrast test slide for checking resolution of microscopes used for asbestos analysis. Fully certified

This test slide is made in the UK under license from the National Physical Laboratory. The purpose of the slide is to provide a standard means to check the performance of phase microscopes prior to the analysis of asbestos. The pattern consists of seven bands of twenty lines with widths ranging from 0.25 microns to 1.1 microns. This slide is the band 5 version where microscopes need to be able to fully view band 5 and partially view band 6.

Each slide is fully tested and approved by the Health & Safety Laboratory, and issued with a certificate.

Key Features

Transmitted light stage slide with 10 x 10 grid of 0.1mm squares

Line width: 0.005mm

Accuracy (overall): <0.0015mm

Key Features

Microscope slide with 200 particles of various shapes and sizes.

Each of the 200 shapes is numbered so that comparison can be done with particles in the specimen, and the details logged and communicated. Is also a useful tool for calibration and operator training. The particle sizes range from 1197um2 to 42308um2.

For pattern size details click here.

Now available with Type Test report that gives size and area information of all 200 particle shapes, contact This email address is being protected from spambots. You need JavaScript enabled to view it. for more information.

Pyser-Optics have facilities to manufacture random and regular patterns for the calibration of particle sizing and counting systems. Typically these may comprise regular shaped features of different sizes so that the imaging software has known reference sizes to set it's calibration. Alternatively, they may have a field area populated with 'random' shaped and sized features. Contact us with your requirements.